Comparison of Er,Cr:YSGG and Diode Lasers In Second Stage Implant Surgery
NCT ID: NCT03819244
Last Updated: 2019-01-29
Study Results
The study team has not published outcome measurements, participant flow, or safety data for this trial yet. Check back later for updates.
Basic Information
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COMPLETED
NA
40 participants
INTERVENTIONAL
2017-11-27
2018-08-20
Brief Summary
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Detailed Description
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Conditions
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Study Design
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RANDOMIZED
PARALLEL
TREATMENT
DOUBLE
Study Groups
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Diode laser
Soft tissue incision with 940 nm Gallium Aluminum Arsenide diode laser, at implant recovery settings (2.5 W output power, average power: 1.25 W, pulse length : 1.00 ms, pulse interval: 1.00 ms) in second-stage implant surgery.
940 nm Gallium Aluminum Arsenide Diode Laser
Exposure of the cover screw of osseointegrated dental implants embedded under oral mucosa by performing the soft tissue incision with diode laser for placing the healing abutment.
Erbium laser
Soft tissue incision with 2780 nm Er,Cr:YSGG laser, at implant recovery settings (2.00 W power, 100 Hz, H mode, 10% water and 10% air) in second-stage implant surgery.
2780 nm Er,Cr:YSGG Laser
Exposure of the cover screw of osseointegrated dental implants embedded under oral mucosa by performing the soft tissue incision with erbium laser for placing the healing abutment.
Interventions
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940 nm Gallium Aluminum Arsenide Diode Laser
Exposure of the cover screw of osseointegrated dental implants embedded under oral mucosa by performing the soft tissue incision with diode laser for placing the healing abutment.
2780 nm Er,Cr:YSGG Laser
Exposure of the cover screw of osseointegrated dental implants embedded under oral mucosa by performing the soft tissue incision with erbium laser for placing the healing abutment.
Eligibility Criteria
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Inclusion Criteria
* subject undergoes second-stage implant surgery.
Exclusion Criteria
* localization of the implant site is not possible due to excessive thickness of the oral mucosa
18 Years
70 Years
ALL
Yes
Sponsors
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Yuzuncu Yıl University
OTHER
Responsible Party
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Erkan Feslihan
Principal investigator
Principal Investigators
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Erkan Feslihan, DDS
Role: PRINCIPAL_INVESTIGATOR
Yuzuncu Yıl University
Locations
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Yuzuncu Yil University Faculty of Dentistry
Van, , Turkey (Türkiye)
Countries
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References
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El-Kholey KE. Efficacy and safety of a diode laser in second-stage implant surgery: a comparative study. Int J Oral Maxillofac Surg. 2014 May;43(5):633-8. doi: 10.1016/j.ijom.2013.10.003. Epub 2013 Nov 7.
Arnabat-Dominguez J, Espana-Tost AJ, Berini-Aytes L, Gay-Escoda C. Erbium:YAG laser application in the second phase of implant surgery: a pilot study in 20 patients. Int J Oral Maxillofac Implants. 2003 Jan-Feb;18(1):104-12.
Provided Documents
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Document Type: Study Protocol and Statistical Analysis Plan
Other Identifiers
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24112017-01
Identifier Type: -
Identifier Source: org_study_id
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