Low-level Laser Therapy With a 635nm Diode Laser on Orthodontic Mini-implants Stability.
NCT ID: NCT04175405
Last Updated: 2019-11-25
Study Results
The study team has not published outcome measurements, participant flow, or safety data for this trial yet. Check back later for updates.
Basic Information
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COMPLETED
NA
20 participants
INTERVENTIONAL
2019-03-06
2019-10-24
Brief Summary
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Detailed Description
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Conditions
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Study Design
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RANDOMIZED
PARALLEL
TREATMENT
SINGLE
Study Groups
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Right side of the maxilla
The 635-nm laser parameters; dose: 10J per point (20J/cm2), time: 100 sec per point, 2 points (irradiation on a buccal, and a palatal side of the alveolus/implant), the total energy per session 20J.
Irradiation of implants with 635nm laser
Irradiation of implants with 635nm laser with a dose of 10J
Left side of the maxilla
No interventions assigned to this group
Interventions
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Irradiation of implants with 635nm laser
Irradiation of implants with 635nm laser with a dose of 10J
Eligibility Criteria
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Inclusion Criteria
* the patients were treated first time using fixed orthodontic appliance;
* no systemic diseases;
* were not using anti-inflammatory drugs;
Exclusion Criteria
* smokers;
* had history of radiotherapy,
* taking bisphosphonate medication
ALL
Yes
Sponsors
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Wroclaw Medical University
OTHER
Responsible Party
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Jacek Matys
Principal Investigator
Locations
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Private Dental Healtcare
Wschowa, , Poland
Countries
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Other Identifiers
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WroclawMU2212
Identifier Type: -
Identifier Source: org_study_id
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